| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |
# Verify device node ls -l /dev/sec_testbd # → crw-rw---- 1 root video 250, 0 Mar 23 12:34 /dev/sec_testbd Sec S3c2443x Test B D Driver
device_create(class, NULL, dev_num, NULL, "sec_testbd"); return 0; | Parameter | Meaning | |-----------|---------| | mode